AL Series X-ray diffractometer is designed for materials reserarch and industrial products analysis. X-ray Powder Diffraction is the perfect combination of conventional analysis with special-purpose measurement products.
X ray diffractometer analyzes natural or synthetic inorganicor organic material, widely used in the field of clay minerals,cement, building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, polymer research.
● The perfect combination of hardware and software systems meets the needs ofacademics and researchers in different application areas.
● High precision diffraction angle measurement system obtains more accurateresults.
● High stability of the X-ray generator control system gets more stable repeatabilityprecision.
● Programmable operation,integrated structure design, easy operation,elegantoutlook.
X-ray Powder Diffraction ( XRD ) is a versatile test instrument to reveal the crystal structureand chemical information:
● Unkown samples in a variety of phase identification.
● Mixed samples with known quantitative phase analysis.
● Crystal structure analysis.
● Crystal structure changes under Unconventional conditions (high temperature,low temperature conditions).
● XRD can Analysis on material surface film.
● Analysis on metal material texture and stress.
Technique parameter
|
|
Rated power |
3kW |
Tube voltage |
10~60kV |
Tube current |
5~80mA |
X-ray tube |
glass tube,ceramic tube,ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
Focus size |
1×10mm or 0.4×14mm or 2×12mm |
Stability |
≤0.01% |
Goniometer structure |
Horizontal(θ-2θ) |
Radius of diffraction |
185mm |
Scanning range |
0~164 |
Scanning speed |
0.0012°~ 70°/min |
Max.revolving speed |
100°/min |
Scanning fashion |
θ-2θ linkage,θ,2θ single action;continuius or stepping scanning |
Angle repeatable accuracy |
1/1000° |
Minimal stepping angle |
1/1000° |
Detector |
proportional counters(PC) or scintillation counters(SC) |
Maximal counting rate of linearity |
5×10°CPS(with the compensate function of drop out counting) |
Energy resolution ratio |
≤25%(PC) ≤50%(SC) |
Counting fashion |
differential coefficient or integral,PHA automatically,Dead time regulate |
Stability of system measure |
≤0.01% |
Scattered rays dose |
≤1μSv/h(without X-ray protective device) |
Instrument integrative stability |
≤0.5% |
Figure size |
1100×850×1750mm |